Archived Materials:
SEMASPECS
NOTE: The following materials are either obsolete or superseded by other documents and are provided for reference only.
Introduction
This listing contains all SEMASPECS published by SEMATECH and a status on those that have been transferred to industry standards organizations for development as industry standards. SEMASPECS are SEMATECH specifications, guidelines, and application notes developed internally or through SEMATECH task forces. These documents represent varying levels of consensus and should not be construed as industry standards.
Mass Flow Controllers
The following Mass Flow Controller documents are in development
as industry standards by SEMI (Semiconductor Equipment and
Materials International). When available, adherence to the
SEMI standard is recommended.
SEMASPEC Guide to Provisional Test Methods for MFCs |
04-Mar-1993 |
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MFC: Accuracy, Linearity, Repeatability, Hysteres |
04-Mar-1993 |
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MFC: Reproducibility and Zero Drift |
04-Mar-1993 |
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MFC: Warm-up Time |
04-Mar-1993 |
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MFC: Determining Reliability |
04-Mar-1993 |
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MFC: Calibration Accuracy and Conversion Factors |
04-Mar-1993 |
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MFC: Particle Contribution |
04-Mar-1993 |
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MFC: Moisture, Oxygen, Hydrocarbon Contribution |
04-Mar-1993 |
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MFC: Performance Char. from Ambient and Gas Temp |
04-Mar-1993 |
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MFC: Pressure Effects on Indicated & Actual Flow |
04-Mar-1993 |
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MFC: Steady-State Supply Voltage Effects |
04-Mar-1993 |
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MFC: Evaluating Electromagnetic Susceptibility |
04-Mar-1993 |
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MFC: Attitude Sensitivity |
04-Mar-1993 |
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MFC: Corrosion Resistance |
04-Mar-1993 |
Test Methods for Gas Distribution System Components
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Test Method for Particle Contribution |
01-Apr-1993 |
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Test Method for Cycle Life of Automatic Valves |
01-Apr-1993 |
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Test Method for Total Hydrocarbon Contribution |
01-Apr-1993 |
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Test Method for SEM Analysis of Metallic Surface |
01-Apr-1993 |
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Test Method for EDX Analysis of Metallic Surface |
01-Apr-1993 |
Documents in Development
The following documents are in development for industry standards by SEMI. When available, the SEMI test method should supercede the SEMASPEC.
Test Method for Helium Leak Rate |
01-Apr-1993 |
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Test Method for Regulator Performance Characteristics |
01-Apr-1993 |
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Test Method for Filter Flow Pressure Drop Curves |
01-Apr-1993 |
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Test Method for Valve Flow Coefficients |
01-Apr-1993 |
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Test Method for Moisture Contribution |
01-Apr-1993 |
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Test Method for Oxygen Contribution |
01-Apr-1993 |
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Test Method for Ionic/Organic Extractables |
01-Apr-1993 |
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Test Method for Surface Roughness |
01-Apr-1993 |
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Test Method for Surface Roughness by STM |
01-Apr-1993 |
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Test Method for AES Analysis of Surface & Oxide |
01-Apr-1993 |
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Test Method for Metallurgical Analysis |
01-Apr-1993 |
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Test Method for Particle Contribution by Regulator |
01-Apr-1993 |
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Test Method for Particle Contribution by Filters |
01-Apr-1993 |
Contamination Control
SEMATECH Guide for Contamination Control in the Design, Assembly, and Delivery of Semiconductor Manufacturing Equipment |
21-Aug-1992 |
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SEMATECH has granted copyright permission to SEMI to develop this document for industry standards. Portions of this document have been incorporated into the SEMI Tool Accommodation Standards. |
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An Extractive Method for Determining Particulate Contamination Levels of Wafer Carriers Using Ultrasonic Extraction: SEMASPEC |
13-Oct-1994 |
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Development of Standard Outgassing Techniques for Detecting Volatile Organic Compounds from Polymer Materials Used in Microenvironments |
07-Apr-1994 |
UPW Component Test Methods
Note: These test methods have not been validated through the SEMATECH project.
Permission to develop the following SEMASPECs for industry standards has been given to SEMI. The SEMI standard, when available, should supercede the SEMASPEC.
Contact SEMI for a status on the standards development.
Guide to Test Methods for UPW Dist. System Compnt. |
26-Jun-1992 |
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Test Method: Sample Prep. for Chemical Testing |
26-Jun-1992 |
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Test Method: Electrical Resistivity of UPW |
26-Jun-1992 |
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Test Method: Leachabable Trace Inorganics |
26-Jun-1992 |
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Test Method: Eval of Bulk Polymer Samples |
26-Jun-1992 |
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Test Method: Bulk Trace Metals in Polymer Matls. |
26-Jun-1992 |
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Test Method: Eval Bulk Polymer Samples (DSC, TGA) |
26-Jun-1992 |
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Test Method: Water Retent. Capac. of Ion-Exchange |
26-Jun-1992 |
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Test Method: Pressure Cycle Testing Filter Cart. |
26-Jun-1992 |
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Test Method: Flow Coefficient of Filter Cartridg. |
26-Jun-1992 |
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Test Method: Pressure Leak Testing Filters |
26-Jun-1992 |
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Test Method: Pressure Proof Testing Filters |
26-Jun-1992 |
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Test Method: Determining
Operational Pressure |
26-Jun-1992 |
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Test Method: Seat Leakage of Control Valves |
26-Jun-1992 |
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Test Method: Leak Testing Tube Fitting Connections |
26-Jun-1992 |
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Test Method: Hydraulic Burst Pressure of Component |
26-Jun-1992 |
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Test Method: Particle Contribution & Retention |
26-Jun-1992 |
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Test Method: Visual Charact. of Surface Roughness |
26-Jun-1992 |
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Test Method: Optical Analysis of Plastic Surface |
26-Jun-1992 |
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Test Method: Determining Surface Roughness (AFM) |
26-Jun-1992 |
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Test Method for Surface Roughness (STM Method) |
26-Jun-1992 |
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Test Method: Surface Roughness (Optical Profiling) |
26-Jun-1992 |
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Test Method: Analyzing Plastic Surface Condition |
26-Jun-1992 |
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Test Method: Surface Comp. & Chemical Binding |
26-Jun-1992 |
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Test Method: Optical Analy. of Ion-Exchange Resins |
26-Jun-1992 |
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Test Method: Surface Associated Biofilms |
26-Jun-1992 |
Information and Control Systems
SEMATECH Stepper Specific Equipment Model (SSEM) |
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SEMATECH Metrology Specific Equipment Model (MSEM) |
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SEMATECH Inspection/Review Specific Equipment Model (ISEM) |
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Device Interoperability Guideline for Sensors, Actuators, and Controllers |
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SEMATECH Computer Integrated Manufacturing (CIM) Framework Specification, Version 2.0 |
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SEMASPEC GEM Purchasing Guidelines 2.0 |
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SCC User Interface Style Guide 1.0 |
Permission to develop the following documents for industry standards has been given to SEMI. The SEMI standard, when available, should supercede the SEMASPEC.


