e-Diagnostics / e-Manufacturing Seminar

16 April 2002

(All Presentations are in .PDF format)

• Welcome / Introduction - H. Wohlwend, International SEMATECH
• “e” Requirements - R. Ronchi, STMicroelectronics
• e-Diagnostics/e-Manufacturing Latest News - H. Wohlwend, International SEMATECH
• EEC Update - B. Van Eck, International SEMATECH
• e-Standards Task Forces: Goals and Status - L. Rist, International SEMATECH
• ISMT Prototyping Experiences - G. Heath, Axeda
• Remote Collaboration - M. Locy, KLA-Tencor
• Field Engineer Support - K. Medberry, Applied Materials
• APC in EEC - N. Heller, Brooks Automation
• Closing Comments - H. Wohlwend, International SEMATECH