| Abstract |
Implementation of Machine Learning for metrology applications in front-end manufacturing: spatial profile estimation and outlier profile detection |
Alegret Cyril, STMicroelectronics |
| Abstract |
On the Application of Machine Learning: is this a Boon or Bust? |
Chris Peterson, Intel |
| Abstract |
High volume statistical scan test analysis as enabler for yield learning |
Dr. Hans-Peter Erb, Infineon |
| Abstract |
Using GUIs for Yield Modeling and Data Mining |
Joel Dobsen, Texas Instruments |
| Abstract |
Stochastic Integration in Design Yield Analysis |
Ed Russell, Sun Microsystems, Inc. |
| Abstract |
Building Models in the Presence of Measurement Error |
Phillip Yates, Infineon |
