| Abstract |
Automation Capabilities Management: Reducing Automation Risk in 300mm Fabs |
Curtis Doss, AMD |
| Abstract |
Maintenance Forecasting for High Volume Manufacturing |
Christopher Conley, Nikon Precision Inc. |
| Abstract |
Semiconductor Equipment Security Challenges |
Anant Raman, Intel |
| Abstract |
Visualization of Manufacturing Data |
Clark Sutton, Texas Instruments |
| Abstract |
Transitioning to Interface A Data Collection |
Larry Barto, AMD |
| Abstract |
Opportunities and Approaches for Using EDA |
Alan Weber, Alan Weber Associates |
