Past Symposia:
2nd ISMI Symposium on Manufacturing Effectiveness
October 24-26, 2005 • Austin, Texas

Agenda-at-a-Glance

Monday, October 24
14:00–16:15  ISMI Members-only Session: Key Competitive Advantages in Manufacturing - Jim Ammenheuser, Chair
  • Spare Parts Database
  • Interface A Success
  • Intentional Defect Arrays for 65nm Technology & Beyond
  • Scatterometry/OCD Equipment Evaluations
  • Pump Energy Reductions
  • Golden Nugget Samples
16:00–19:00 Registration Open
17:00–19:30 Welcome Reception and Networking, Poster viewing
 
Tuesday, October 25
07:30–08:00 Continental Breakfast
08:00–08:15 Opening Remarks: Scott Kramer, Director ISMI
08:15–08:30 Welcome: OB Bilous, SEMATECH Chairman of the Board
08:30–09:15 Keynote Address: "Advanced Foundry in the Consumer Electronics Era"
Mark Liu, VP Operations II, TSMC
09:25–12:25 Morning Parallel Sessions
  Session 1: Fab Productivity - Mike Schwartz, chair
  Session 2: Manufacturing Sustainability - James Beasley, chair
  Session 3: Statistical Methods: Statistical Approaches to Resolving Yield and Metrology Issues - Diane K. Michelson, Don McCormack, chair
  Session 4: AMHS Simulation & Capacity Modeling - Robert Wright, chair
12:30–13:50 Lunch
14:00–17:00 Afternoon Parallel Sessions
  Session 5: Equipment Productivity - Neal Marmillion, chair
  Session 6: Design for Environment, Safety, and Health - James Beasley, chair
  Session 7: Statistical Methods: Statistical Process Control - Diane K. Michelson, Don McCormack, chair
  Session 8: Yield/Metrology (1) – Ron Remke, chair
17:00–19:00 Reception & Networking -- Technical Poster Session
 
Wednesday, October 26
07:30–08:00 Continental Breakfast
08:00–08:15 Welcome and Introduction: Scott Kramer, Director ISMI
08:15–09:00 Keynote Address: "Accelerating Innovation Through Partnerships in Development and Manufacturing"
Paul Farrar, VP for Semiconductor Process Development, IBM
09:10–12:10 Morning Parallel Sessions
  Session 9: Yield/Metrology (2) - Dilip Patel, chair
  Session 10: Future Fab Design - Phil Naughton, chair
  Session 11: Statistical Methods: Topics in the Application of Statistical Methods to Semiconductor Data - Diane K. Michelson, Don McCormack, chair
  Session 12: e-Manufacturing - Brad Van Eck, chair
12:10–13:50 Lunch
14:00–16:00

Session 13: Helping today's factory and shaping the future factories
ITRS Factory Integration Overview - Mani Janakiram, Manager, Analysis and Control Technologies, Intel
Panel/Open Discussion - Tom Cheyney, Micro Editor-in-Chief, Moderator

Panel Members:

  • Eric Englhardt – AMAT
  • Arieh Greenberg – Infineon
  • Mani Janakiram - Intel
  • Shige Kobayashi – Renesas
  • Michael O’Halloran - IDC
16:00–16:45 Closing Keynote: "40 Years of Moore's Law"
Dan Hutcheson, CEO of VLSI Research, Inc.
16:45 Adjourn