| Abstract |
SPC Can Save Your APC |
|
Kevin Anderson, Intel |
| Abstract |
A Potential Approach for Monitoring Fab Cycle Time Performance through Dynamic X-Factor Control Charts |
|
Jennifer Robinson & Frank Chance (FabTime). Presented by Jennifer Robinson, FabTime |
| Abstract |
Jeopardy Monitoring for Defect Inspection and THK Measurement |
|
Frank Wagenbreth, AMD |
| Abstract |
Learning Methods for Process Fault Detection and Diagnosis |
|
George Runger, Arizona State University MASM Lab & Eugene Tuv, Intel |
| Abstract |
Desirability Index: An EKG for Your SPC System |
|
Phillip Yates, Infineon Technologies |
