| Abstract |
D-Optimal Split Plot Designs |
|
Brad Jones, JMP |
| Abstract |
Defects-based Yield Modeling in Semiconductor Manufacturing |
|
Michael Baron (University of Texas, Dallas), Asya Takken (IBM), Mary Wisniewski (IBM) and Emmanuel Yashchin (IBM). Presented by Michael Baron, University of Texas |
| Abstract |
Modeling Distribution Networks Using Stochastic Simulation and Response Surface Models |
|
Kurt Johnson & Michael Waithe (Intel). Presented by Kurt Johnson, Intel |
| Abstract |
Process Improvement using a Response Surface Methodology Experiment (RSM) for Chemical Polish (CMP) Nonuniformity Reduction |
|
Joel Dobson & Michael Lube, Texas Instruments. Presented by Joel Dobson, TI |
| Abstract |
Selecting Sample Sizes or What the Books Don't Tell You |
|
Kathryn Hall, HP |
| Abstract |
On the Use of Generalized P-Values to Test Variance Components |
|
Diane K. Michelson, ISMI |
