| Abstract |
On the Use of Machine Learning in the Semiconductor Industry: Examples and Case Studies |
|
Theresa Utlaut & Kevin Anderson, Intel. Presented by Theresa Utlaut, Intel |
| Abstract |
Sameness: A Statistical Tool |
|
Kiami Rogers, TI |
| Abstract |
Leveraging Design for Process Technology Evaluation Prior to First Silicon |
|
Ed Russell, Sun Microsystems |
| Abstract |
A Method for Comparing Grossly Non-parametric Distributions with Two Examples |
|
Nechama Katan, Intel |
| Abstract |
Using Simple Tools to Solve Complex Reliability Analysis Problems |
|
Paul Tobias, Consultant |
| Abstract |
Statistics Training vs Six Sigma Training – A Comparison of Pros and Cons |
|
Ledi Trutna & Diana Ballard, Consultants |
