Past Symposia:
1st ISMI Symposium on Manufacturing Effectiveness

Session1: Fab Productivity
Mike Schwartz, Chair

Abstract   Process Control Management System B. Biskey, M. Fletcher, & T. Yurtsever, Freescale
Abstract   Real Time Dispatch: Scheduling the Future in Burlington D.Maynard, IBM
Abstract   Improving Mfg. Operations at TI DMOS5 Wafer Fab S.Walker, & K.Potti, Texas Instruments
Abstract   Lot Size Optimization in 300mm 90nm Production for ultra-short Cycle Times E.J.J van Campen & B.Lemmen, Philips SC Crolles 2
Abstract   TI-DMOS6 300mm Wafer Fab Pilot Management Methodologies B. Brown, Texas Instruments
Abstract   E-Mfg: The Enabling Highway for Factory Productivity Improvement S. Fulton, ISMI



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