Past Symposia:
1st ISMI Symposium on Manufacturing Effectiveness

25-28 October 2004
Omni Hotel Austin
Austin, Texas
Go to Agenda

 
Gold Sponsor:
HCL Technologies | SEMI

Silver Sponsors: 
IDC Architects | JMP | M+W Zander | Novellus

Future Fab International is serving as Media Partner
for the ISMI Symposium

Get Ready for the Revolution In Fab Productivity!

"The new economy for microelectronics - with multibillion-dollar fabs and budget-busting technologies - will force IC manufacturers to seek unprecedented levels of productivity over the next five years."

- John Schmitz, COO, SEMATECH

Get the inside data on maximizing fab productivity - from ISMI, the world's only consortium dedicated to semiconductor manufacturing

Discover the cutting-edge statistical tools – for improving your manufacturing effectiveness and slashing your costs.

Get ready for the manufacturing challenges of the future - fully automated fabs, 100% die yield, realizing theoretical cycle time, and more.

Catch up on progress in "green" fab design from expert case studies – and learn how to meet future-fab design requirements and ITRS challenges for ultrapure water and cleanroom designs.

Hear the latest trends for sustaining improvements in IC productivity and profitability from a panel of industry experts – including Sam Angelos, Hewlett-Packard; Dan Hutcheson, VLSI Research; Robert Leachman, UC Berkeley; Stuart McIntosh, ASML; Devadas Pillai, Intel; John Schmitz, SEMATECH; Louis Steen, Tokyo Electron America; and Randy Goodall, SEMATECH.


This first-ever symposium from ISMI (the International SEMATECH Manufacturing Initiative) will focus on reducing manufacturing costs through advances in equipment, process, resources, fab design, and manufacturing methods both in existing and next-generation factories. An expert panel will discuss strategies for answering the pressing cost and productivity challenges to the IC industry - strategies that will require revolutionary approaches. Key manufacturing issues will be addressed along three parallel tracks: productivity, fab design, and statistical methods.

Speakers to catch:

Mike Polcari, President and CEO of SEMATECH, will give a brief welcome to participants and outline the productivity challenges to the industry.

James E. Doran, Executive Vice President and Board member,
Spansion LLC and Senior Vice President, AMD, on how to piece together the competitive puzzle to keep your company strong and prosperous.

Shaunna Sowell, Vice President, Manager DFAB, Texas Instruments, on TI's decision to locate its newest 300 mm fab in Texas, with advice on how to keep manufacturing in your community.

Presentations you don't want to miss:

"SPC Can Save Your APC," by Kevin C. Anderson, Senior Staff Technologist and Statistician, Intel Corp . This presentation will discuss strengths and myths of advanced process control (APC), detail possible issues resulting from sub-optimal APC implementation, and offer some approaches for detecting those issues by focusing statistical process control (SPC) on the APC system itself.

"Designing for a Low Environmental-Impact 300 mm Fab," by Daniel Seif, Advanced Micro Devices . Learning from six years of prior fab operations in Dresden, Germany, AMD's Fab 36 will utilize a natural gas-driven cogeneration facility, ultrapure water recycling, perfluorocarbon abatement, and energy efficient support facility features. Fab 36 will use augmentations and improvements of all these systems, plus new tool and process eater, chemical, and energy-reduction technologies.

"Establishing Competitive Semiconductor Manufacturing for 0.13 µm Copper Technology and Beyond," by John Allgair, Brad Miles and Marline Manassian, Freescale Semiconductor . Topic will be Freescale Semiconductor's methodology for improving manufacturing effectiveness to world-class levels, including 40% reduction in cycle time, 80% improvement in turns per direct labor hour, and 30% reduction in manufacturing costs.

"On the Use of Machine Learning in the Semiconductor Industry: Examples and Case Studies," by Theresa L. Utlaut, Logic Technology Development, Intel (Hillsboro, OR) and Kevin C. Anderson, Yield Engineering Department, Intel (Rio Rancho, NM). Semiconductor fabs generate huge quantities of data, but engineers may be hard put to analyze it all effectively. Machine learning uses computer algorithms to improve performance by data analysis, rather than relying on the skill and intuition of the analysts. Case studies will demonstrate the utility of machine learning approaches in description, prediction, and hypothesis generation.


Agenda

Monday, 25 October
16:00 - 19:00     Registration Open
17:00 - 19:30 Welcome Reception and Networking
 
Tuesday, 26 October
7:30 - 8:00 Continental Breakfast
8:00 - 8:05 Introduction and General Remarks: Randy Goodall
8:05 - 8:15 Opening Remarks: Judge Jeff Moseley, Office of the Governor
8:15 - 8:30 Welcome: Mike Polcari, SEMATECH CEO
8:30 - 9:00 Keynote Address: James Doran, Senior Vice President, AMD
9:10 - 12:10 Morning Parallel Sessions
Session 1: Fab Productivity
Session 2: Meeting the ITRS Roadmap for Future Fab Design
Session 3: Statistical Methods - Applications
12:10 - 13:30 Lunch
13:30 - 16:30 Afternoon Parallel Sessions
Session 4: Equipment Productivity
Session 5: Sustaining and Greening our Fabs for the Future
Session 6: Statistical Methods - Modeling and DOE
17:00 - 19:00 Reception & Networking
 
Wednesday, 27 October
7:30 - 8:00 Continental Breakfast
8:00 - 8:15 Introduction: Scott Kramer, ISMI
8:15 - 8:45 Keynote Address: Shauna Sowell, Texas Instruments
9:00 - 11:40 Morning Parallel Sessions
Session 7: Yield & Metrology
Session 8: Design Challenges for Our Future Fabs
Session 9: Statistical Methods - Statistical Process Control
11:45 - 13:15 Lunch
13:15 - 14:00 ISMI Strategic View: Scott Kramer
14:00 - 15:30 Expert Panel Discussion on Strategic View
15:30 - 15:45 Break
15:45 - 16:15 Symposium Summary
16:15 Adjourn
16:15 - 17:00 Press Reception and Panel Q&A
 
Thursday, 28 October
7:30 - 17:00 Public tour of Advanced Technology Development Facility (ATDF) and selected meetings at ISMI