95012684A-TR Abstract: Software Measurement for Semiconductor Manufacturing Equipment

SEMATECH DOC ID #: 95012684A-TR

Title: Software Measurement for Semiconductor Manufacturing Equipment

Author(s): Fred Langner;Herb Krasner;

Document date: 03/16/1995

Descriptor(s): software development;software development life cycle;software reliability;software reuse;metrology;Software Process Improvement;

Abstract: This document defines an introductory set of software metrics to be used by
equipment and software suppliers to SEMATECH member companies. These
metrics--developed by SEMATECH's Software Process Improvement (SPI)
Project--are designed to measure the size, effort, progress to schedule, and
product quality for software projects. The document identifies four basic
measures for evaluating software systems; outlines actions for implementing
the measures; and illustrates how they can be used to provide early warnings,
generate reliable projections, and suggest and evaluate process improvements.
The metrics are designed to help supplier companies plan, manage, and improve
the lifecycle process of software systems. Although specific actions will vary
at individual sites, some general recommendations for use of the metrics are
provided.

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